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微观组织的分析 电子显微学表征-英文版 内容简介
本收系统地介绍了分析电子显微学（aem）的基本概念和操作技术，聚集于相恋和形变中位错的aem研究。同时通过大量的例子阐述衍射晶体学的物理概念和数学分析方法，例如相变中位向关系的定量预测等，以便读者加深理解和拓展视野。
微观组织的分析 电子显微学表征-英文版 目录
chapter 1 analytical electron microscope (aem)
1.1 brief introduction of aem history
1.2 interaction between electrons and specimen and signals used by
aem
1.3 electron wavelength and electromagnetic lens
1.3.1 electron wavelength
1.3.2 electromagnetic lens
1.4 structure and function of aem
1.4.1 illumination system
1.4.2 specimen holders
1.4.3 imaging system
1.4.4 image recording
1.4.5 power supply system and vacuum system
1.4.6 computer control '
1.5 the principle of imaging, magnifying and diffracting
1.6 theoretical resolution limit
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