19 magneto-optic kerr effect (moke)
  20 medium-energy ion scattering with channeling and blocking (meis)
  21 neutron activation analysis (naa)
  22 nuclear reaction analysis (nra)
  23 optical micro-reflectometry (omr) and differential reflectometry (dr)
  24 optical second harmonic generation (shg)
  25 particle-induced x-ray emission (pixe)
  26 photoacoustic spectroscopy (pas)
  27 photoelectron emission microscopy (peem)
  28 photoluminescence (pl)
  29 reflected electron energy-loss spectroscopy (reels)
  30 reflection high-energy electron diffraction (rheed)
  31 rutherford backscattering spectrometry (rbs)
  32 scanning electron microscopy (sem)
  33 scanning transmission electron microscopy (stem)
  34 scanning tunneling microscopy and scanning force microscopy(stm and sfm)
  35 solid state nuclear magnetic resonance (nmr)
  36 spark source mass spectrometry (ssms)
  37 sputtered neutral mass spectrometry (snms)
  38 static secondary ion mass spectrometry (static sims)
  39 surface analysis by laser ionization (sali)
  40 surface extended x-ray absorption fine structure and near edge x-ray absorption fine structure (sexafs/nexafs)
  41 temperature programmed desorption (tpd)
  42 total reflection x-ray fluorescence analysis (txrf)
  43 transmission electron microscopy (tem)
  44 ultraviolet photoelectron spectroscopy (ups)
  45 variable-angle spectroscopic ellipsometry (vase)
  46 x-ray diffraction (xrd)
  47 x-ray fluorescence (xrf)
  48 x-ray photoelectron and auger electron diffraction (xpd and aed)
  49 x-ray photoelectron spectroscopy (xps)
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