ionizing—probetechnique
6.4 surface potentials of organicthin films
air—water interface： surface potential of langmuir mono— layers
air—solidlnterface： surface potential of l—b and related films
6.5 conclusions
x—ray diffraction
7.1 introduction
7.2 basic principles
7.3 structure normal to film plane
7.4 structure within the film plane
7.5 summary
high resolution eels studies of organic thin films and surfaces
8.1 introduction
8.2 thescatteringmechanism
dipolescattering
impact scattering
resonance scattering
8.3 thespectrometer
8.4 eels versus other techniques： advantages and disadvantages
8.5 examples
resolutionenhancement
linearity
depth sensitivity
molecular orientation
local versus long—range lnteractions
surfaces egregation
8.6 conclusions
wetting
9.1 introduction
9.2 contactangles
9.3 techniques for contact angle measurements
axisymmetric drop shapeanalysis—profile （adsa—p）
axisymmetric drop shape analysis—contact diameter （adsa—cd）
capillary rise technique
9.4 phase rule for moderately curved surface systems
9.5 equation of state forinterfacialtensions of solid— liquid systems
9.6 drop size dependence of contact angle and line tension
9.7 contact angles in the presence ofa thin liquid film
9.8 effects ofelastic liquid—vaporlnterfaces on wetting
secondary ion mass spectrometry as applied to thin organic and polymeric films
10.1 introduction and background
overview of the sims method and experiment
ion formationmechanisms
comparisons to other surface analysis techniques
the motivation for thin organic films as model systems
10.2 qualitative information： mechanisms ofsecondary molecularlon formation
structure—ion formation relationships
applications to self—assembled film chemistry
10.3 the study ofsampling depth in the sims experiment
10.4 quantitationin sims
development of quantitation methods
applicationof quantitative schemes to thin film chemistry
10.5 imagingapplications
10.6 summary and prospects
x—ray photoelectron spectroscopy of organic thin films
11.1 introduction
11.2 experimental considerations
11.3 binding energy shifts
11.4 xps of molten films
11.5 angular dependent xps
11.6 etoaxps of self—assembled monolayers
11.7 conclusions
molecular orientation in thin films as probed by optical second harmonic generation
12.1 introduction
12.2 experimental considerations
12.3 molecular nonlinear polarizabiliry calculation
12.4 measurements of the surface nonlinear susceptibility
12.5 molecular orientation calculation
casel：βzzzonly
case2：βzxxonly
case3： βxxz（=βxzx）only
case4：βzzz and βzxx
case5： βzxx and βxxz（=βxzx）
12.6 absolute molecular orientation measurements
12.7 summary and conclusions
appendix： technique summaries
i auger electron spectroscopy（aes）
2 dynamicsecondarylon mass spectrometry （dynamicsims） 252
3 fouriertransformlnfraredspectroscopy（ftir） 253
4 high—resolution electron energy loss spectroscopy （hreels）
5 low—energy electron diffraction（leed）
6 raman spectroscopy
7 scanning electron microscopy（sem）
8 scanning tunneling microscopy（stm） and scanning force microscopy （sfm）
9 static secondarylon mass spectrometry （static sims）
10 transmission electron microscopy（tem）
11 variable—angle spectroscopic ellipsometry（vase）
12 x—ray diffraction xrd）
13 x—ray fluorescence（xrf）
14 x—ray photoelectron spectroscopy（xps）
index 

有机薄膜的表征 作者简介

作者：（美国）布伦德尔（C.Richard Brundle） （美国）埃文斯（Charles A.Evans） （美国）乌尔曼（Abraham Ulman） 　　乌尔曼（Abraham Ulman），Analytical tools for the study of organic thin films have seen dramatic developments in the last decade.Using such tools it has become possible to obtain structural information at the molecular level and thus to relate materials structure to materials properties.Characterization of Organic Thin Films will help materials scientists， physicists， chemists， and biologists develop a fundamental understanding of structure—properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing.This volume begins with introduc—tory chapters on Langmuir—Blodgett and self—assembled films， and continues with the discussion of their properties as studied by different analytical tech—niques.Both their surface/interfacial and bulk properties are covered. 

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